Vergabe BB-Semi-automatic prober for characterization of 200 mm wafers-CXSTYYDDYD9F9RH8
Data and Resources
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Additional Info
| Field | Value |
|---|---|
| Last Updated | October 2, 2026, 16:32 (UTC) |
| Created | September 19, 2026, 18:25 (UTC) |
| auftragsgegenstand | 38540000-2 Maschinen und Geräte zum Prüfen und Messen |
| cpv_main | 38540000-2 |
| notice_type | VgV Ausschreibung |
| publication_date | 2026-09-13 |
| publisher | IHP GmbH - Leibniz-Institut für innovative Mikroelektronik |
| question_deadline | 05.10.2026 23:59 Ortszeit |
| short_title | Semi-automatic prober for characterization of 200 mm wafers |
| submission_deadline | 13.10.2026 |