not-val law-enf -1 RES-0001 selec-w TEN-0001 tenders 1 t-esubm 1 t-sme 0 t-oth-eea 0 t-no-eea 0 CON-0001 LOT-0000 win-ten-val law-enf TEN-0001 -1 no TPA-0001 LOT-0000 TEN-0001 CON-0001 2026-10-28+01:00 CON-0001 TEN-0001 TPA-0001 ORG-0001 29 false false https://vergabe.fraunhofer.de/ ORG-7001 Fraunhofer-Gesellschaft, Einkauf B12 Fraunhofer-Gesellschaft, Einkauf B12 Hansastraße 27c München 80686 DE212 DEU DE 129515865 Einkauf Wissenschaftliche Geräte +49891205-0 einkauf@zv.fraunhofer.de ORG-7004 Vergabekammern des Bundes Vergabekammern des Bundes Kaiser-Friedrich-Straße 16 Bonn 53113 DEA22 DEU t:022894990 +49 228 9499-0 vk@bundeskartellamt.bund.de https://www.fraunhofer.de ORG-7005 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Hansastraße 27c München 80686 DE212 DEU DE-129515865 +49 89 1205-0 einkauf@zv.fraunhofer.de false UBO-0001 large ORG-0001 CAMECA SAS CAMECA SAS 29, quai des Grésillons Gennevilliers Cedex 92230 FR105 FRA FR67403092216 +49 15222895868 Rene.Chemnitzer@ametek.com ORG-7006Datenservice Öffentlicher Einkauf (in Verantwortung des Beschaffungsamts des BMI)Datenservice Öffentlicher Einkauf (in Verantwortung des Beschaffungsamts des BMI)Bonn53119DEA22DEU0204:994-DOEVD-83+49228996100noreply.esender_hub@bescha.bund.de UBO-0001 FRA 00751866-2026210/20262026-10-29+01:00 2.3 eforms-sdk-1.13 eforms-sdk-1.13 60fecbae-1e2a-4100-95f2-a389f40ad3f2 07d5f8ae-fb66-4891-a6f8-a839f96af77e 2026-10-28+01:00 10:26:47+01:00 01 2026-10-28+01:00 32014L0024 can-standard DEU ENG https://vergabe.fraunhofer.de/NetServer/ pub-undert gen-pub ORG-7001 ted-esenORG-7006 vgv open false false PR1195891-2050-W Secondary ion mass spectrometer (SIMS) - PR1195891-2050-W Secondary ion mass spectrometer (SIMS) - PR1195891-2050-W Secondary ion mass spectrometer (SIMS) Secondary ion mass spectrometer (SIMS) supplies 42990000 Freiburg 79108 DE131 DEU LOT-0000 false false no-eu-funds per-exa 65.00 quality Technik Technik Technik Technik per-exa 35.00 price Preis Price Preis Price ORG-7001 ORG-7005 ORG-7004 true false none none LOT-0000 Secondary ion mass spectrometer (SIMS) - PR1195891-2050-W Secondary ion mass spectrometer (SIMS) - PR1195891-2050-W 1 pc. The objective is to procure a highly sensitive SIMS instrument for depth‑profiled chemical analysis of semiconductor materials and structures, offering high depth resolution and high mass resolving power. The system shall enable precise dopant and impurity profiling, as well as accurate determination of layer thickness and homogeneity, with a focus on characterizing advanced III‑V and diamond‑based device structures and epitaxial layers, including 150 mm substrates, to support process development, quality control and optimization at Fraunhofer IAF. 1 pc. The objective is to procure a highly sensitive SIMS instrument for depth‑profiled chemical analysis of semiconductor materials and structures, offering high depth resolution and high mass resolving power. The system shall enable precise dopant and impurity profiling, as well as accurate determination of layer thickness and homogeneity, with a focus on characterizing advanced III‑V and diamond‑based device structures and epitaxial layers, including 150 mm substrates, to support process development, quality control and optimization at Fraunhofer IAF. supplies none 42990000 Freiburg 79108 DE131 DEU 18 2000-01-01+01:00